Scanning Thermo Probe Technique - A Method for High Resolution Characterization of Graded Semiconductors and Metals
Reinshaus, P., Süßmann, H., Erz, G., Kramer, U., Heiliger, W.Volume:
308-311
Year:
1999
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.308-311.890
File:
PDF, 354 KB
1999