Automatic Full-Field 3-D Profilometry Using White Light...

Automatic Full-Field 3-D Profilometry Using White Light Confocal Microscopy with DMD-Based Fringe Projection

Chen, Liang Chia, Kao, Wei Chieh, Huang, Yao Ting
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Volume:
505-507
Year:
2006
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.505-507.361
File:
PDF, 1.08 MB
english, 2006
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