Scanning Transmission Electron Beam Induced Current in...

Scanning Transmission Electron Beam Induced Current in Polycrystalline Silicon

Cabanel, C., Maurice, J.L., Laval, J.Y.
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Volume:
10-12
Year:
1986
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.10-12.545
File:
PDF, 451 KB
1986
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