Detecting Point Pattern of Multiple Line Segments Using...

IEEE Transactions on Semiconductor Manufacturing 2015 / 2 Vol. 28; Iss. 1

Detecting Point Pattern of Multiple Line Segments Using Hough Transformation

Liu, Yuhang, Zhou, Shiyu
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Volume:
28
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2014.2385600
Date:
February, 2015
File:
PDF, 1.66 MB
english, 2015
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