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Structural and gas response characterization of nano-size SnO2 films deposited by SILD method
G. Korotcenkov, V. Macsanov, V. Tolstoy, V. Brinzari, J. Schwank, G. FagliaVolume:
96
Year:
2003
Language:
english
Pages:
8
DOI:
10.1016/j.snb.2003.07.002
File:
PDF, 324 KB
english, 2003