![](/img/cover-not-exists.png)
Investigation on Ag/Ti Ohmic Contacts to Si-Doped n-Type Al0.27Ga0.73N and the Effect of Post Annealing Treatments
Othman, Surina, Yam, F.K., Abu Hassan, H., Hassan, Z.Volume:
517
Year:
2006
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.517.281
File:
PDF, 391 KB
english, 2006