[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Dielectric Relaxation and Defect Generation Under Pulsed and Constant Voltage Stressing of Ultrathin TiO2 Films on Strained-Si/Si
Bera, Milan K., Saha, Satyajit, Maiti, Chinmay K.Volume:
3
Year:
2006
Language:
english
DOI:
10.1149/1.2355918
File:
PDF, 283 KB
english, 2006