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Effect of Double-Layered Al[sub 2]O[sub 3] Gate Insulator on the Bias Stability of ZnO Thin Film Transistors
Yoon, Sung-Min, Ko Park, Sang-Hee, Yang, Shin-Hyuk, Byun, Chun-Won, Hwang, Chi-SunVolume:
13
Year:
2010
Language:
english
Journal:
Electrochemical and Solid-State Letters
DOI:
10.1149/1.3428745
File:
PDF, 314 KB
english, 2010