Growth and Characterization of Thin Films and Patterned...

Materials Science Forum 1998 Vol. 264-268

Growth and Characterization of Thin Films and Patterned Substrates of III-V Nitrides on SiC (0001) Substrates

Davis, Robert F., Bremser, M.D., Nam, O.H., Zheleva, T.S., Perry, W.G., Ward, B.L., Nemanich, Robert J.
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Volume:
264-268
Year:
1998
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.264-268.1111
File:
PDF, 443 KB
1998
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