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Relation between noise and resolution in integrated optical refractometric sensing
Hugo J.W.M. Hoekstra, Paul V. Lambeck, Henri P. Uranus, Ton M. KosterVolume:
134
Year:
2008
Language:
english
Pages:
9
DOI:
10.1016/j.snb.2008.06.025
File:
PDF, 507 KB
english, 2008