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Positronium Time-Of-Flight Measurements of Porous Silsesquioxane Films
Yu, Run Sheng, Ohdaira, Toshiyuki, Kobayashi, Yoshinori, Suzuki, Ryoichi, Ito, Kenji, Hirata, Kouichi, Sato, KimiyasuVolume:
445-446
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.445-446.361
File:
PDF, 322 KB
english, 2004