Hall Effect Measurements on New Thermoelectric Materials
Short, Jarrod, Loo, Sim, Lal, Sangeeta, Hsu, Kuei Fang, Quarez, Eric, Kanatzidis, Mercouri G., Hogan, Timothy P.Volume:
793
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-793-S8.35
Date:
January, 2003
File:
PDF, 906 KB
english, 2003