A New Method for the Characterization of Electronic...

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IEEE Transactions on Instrumentation and Measurement 2015

A New Method for the Characterization of Electronic Components Immunity

Ayed, Ala, Dubois, Tristan, Levant, Jean-Luc, Duchamp, Genevieve
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.2015.2412014
File:
PDF, 2.62 MB
english, 2015
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