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In-Situ SEM/EBSP Analysis during Annealing in a Pure Aluminum Foil for Capacitor
Kobayashi, Masakazu, Takayama, Yoshimasa, Kato, Hajime, Toda, HiroyukiVolume:
539-543
Year:
2007
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.539-543.362
File:
PDF, 2.77 MB
english, 2007