Characterizing Native Point Defects in ZnO Bulk by Positron Annihilation Spectroscopy
Peng, C.X., Weng, Hui Min, Wang, K.F., Guo, F.L., Ye, B.J., Zhou, X.Y., Han, Rong DianVolume:
607
Year:
2009
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.607.137
File:
PDF, 705 KB
english, 2009