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Defects generation by hydrogen passivation of polycrystalline silicon thin films
S. Honda, T. Mates, M. Ledinský, A. Fejfar, J. Kočka, T. Yamazaki, Y. Uraoka, T. Fuyuki, H. Boldyryeva, A. Macková, V. PeřinaVolume:
80
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.solener.2005.10.013
File:
PDF, 253 KB
english, 2006