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Study on Indentation-Sliding Contact Conditions between Semiconductor Terminal and Electrically Testing Probes
Saiki, Hiroyuki, Marumo, Yasuo, Ruan, Liqun, Haraguchi, Ryuuta, Moriyama, MitsuhiroVolume:
505-507
Year:
2006
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.505-507.295
File:
PDF, 1.49 MB
2006