Application of a New Rietveld Software for Quantitative...

Application of a New Rietveld Software for Quantitative Phase Analysis and Lattice Parameter Determination of AIN-SiC-Ceramics

Taut, T., Bergmann, J., Schreiber, G., Börner, A., Müller, Eberhard
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Volume:
228-231
Year:
1996
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.228-231.177
File:
PDF, 397 KB
1996
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