![](/img/cover-not-exists.png)
Application of a New Rietveld Software for Quantitative Phase Analysis and Lattice Parameter Determination of AIN-SiC-Ceramics
Taut, T., Bergmann, J., Schreiber, G., Börner, A., Müller, EberhardVolume:
228-231
Year:
1996
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.228-231.177
File:
PDF, 397 KB
1996