High Quality GaN on Si(111) using (AlN/GaN)x Superlattice and Maskless ELO
Lahrèche, H., Bousquet, V., Laügt, M., Tottereau, Olivier, Vennéguès, P., Beaumont, B., Gibart, PierreVolume:
338-342
Year:
2000
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.338-342.1487
File:
PDF, 337 KB
2000