Mechanism of Dynamic Negative Bias Temperature Instability of p-MOSFETs with 13 Å Oxynitride Gate Dielectric
Pan, Tung-Ming, Liu, Chuan-HsiVolume:
8
Year:
2005
Language:
english
Journal:
Electrochemical and Solid-State Letters
DOI:
10.1149/1.2109287
File:
PDF, 462 KB
english, 2005