Investigation of Amorphous InGaZnO Based TFT Interface Properties with Synchrotron Radiation Analysis
Joo, Minho, Choi, Jongkwon, Noh, Seokhwan, Park, Kyuho, Ihm, Kyuwook, Kim, Kijeong, Kang, TaiheeVolume:
1108
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1108-A09-08
Date:
January, 2008
File:
PDF, 216 KB
english, 2008