Determination of the interdiffusion coefficient for the CdS/CdTe heteroestructure by AES sputter depth profiling
E. Gómez-Barojas, R. Silva-González, J. Pantoja-EnríquezVolume:
90
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.solmat.2006.02.022
File:
PDF, 273 KB
english, 2006