![](/img/cover-not-exists.png)
Dislocation-related deep levels in carbon rich p-type polycrystalline silicon
I. Capan, V. Borjanović, B. PivacVolume:
91
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.solmat.2007.02.011
File:
PDF, 208 KB
english, 2007