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[IEEE 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Taipei, Taiwan (2014.10.27-2014.10.31)] 2014 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - AFM tip-induced dielectrophoresis for 3D manipulation of nanoparticles
Zhou, Peilin, Cong, Peitian, Yu, Haibo, Li, Peng, Wei, Fanan, Liu, LianqingYear:
2014
Language:
english
DOI:
10.1109/3m-nano.2014.7057318
File:
PDF, 528 KB
english, 2014