A method to measure resistivity, mobility, and absorber thickness in thin-film solar cells with application to CdTe devices
Jian V. Li, Xiaonan Li, David S. Albin, Dean H. LeviVolume:
94
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.solmat.2010.06.018
File:
PDF, 432 KB
english, 2010