A method to measure resistivity, mobility, and absorber...

A method to measure resistivity, mobility, and absorber thickness in thin-film solar cells with application to CdTe devices

Jian V. Li, Xiaonan Li, David S. Albin, Dean H. Levi
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Volume:
94
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.solmat.2010.06.018
File:
PDF, 432 KB
english, 2010
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