Modeling of Subthreshold Characteristics for Double Gate...

ECS Transactions 2014 / 02 Vol. 60; Iss. 1

Modeling of Subthreshold Characteristics for Double Gate MOSFET Using Neural Networks and Genetic Algorithm

Cho, E. N., Shin, Y. H., Moon, P., Yun, I.
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Volume:
60
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/06001.1033ecst
Date:
February, 2014
File:
PDF, 185 KB
english, 2014
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