Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence
J.A. Giesecke, M.C. Schubert, B. Michl, F. Schindler, W. WartaVolume:
95
Year:
2011
Language:
english
Pages:
8
DOI:
10.1016/j.solmat.2010.12.016
File:
PDF, 653 KB
english, 2011