Reliable Physical Unclonable Functions Using Data Retention...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2015 / 6 Vol. 34; Iss. 6

Reliable Physical Unclonable Functions Using Data Retention Voltage of SRAM Cells

Xu, Xiaolin, Rahmati, Amir, Holcomb, Daniel E., Fu, Kevin, Burleson, Wayne
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Volume:
34
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2015.2418288
Date:
June, 2015
File:
PDF, 5.43 MB
english, 2015
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