[IEEE 2003 Conference on Computer Vision and Pattern...

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[IEEE 2003 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW) - Madison, Wisconsin, USA (2003.06.16-2003.06.22)] 2003 Conference on Computer Vision and Pattern Recognition Workshop - Salient Features and Hypothesis Testing: evaluating a novel approach for segmentation and address block location

Menoti, David, Borges, Dibio Leandro, Britto Jr, Alceu de Souza
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Year:
2003
Language:
english
DOI:
10.1109/cvprw.2003.10022
File:
PDF, 782 KB
english, 2003
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