SiC X-Ray Detectors for Spectroscopy and Imaging over a...

Materials Science Forum 2003 Vol. 433-436

SiC X-Ray Detectors for Spectroscopy and Imaging over a Wide Temperature Range

Bertuccio, Giuseppe, Casiraghi, R., Gatti, E., Maiocchi, D., Nava, Filippo, Canali, C., Cetronio, Antonio, Lanzieri, Claudio
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Volume:
433-436
Year:
2003
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.433-436.941
File:
PDF, 257 KB
english, 2003
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