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Distinction of the Nuclei of Shockley Faults in 4H-SiC{0001} pin Diodes by Electroluminescence Imaging
Ishii, R., Miyanagi, Toshiyuki, Kamata, Isaho, Tsuchida, Hidekazu, Nakayama, Koji, Sugawara, YoshitakaVolume:
556-557
Year:
2007
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.556-557.251
File:
PDF, 477 KB
english, 2007