[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - A data recomputation approach for reliability improvement of scratchpad memory in embedded systems
Sayadi, Hossein, Farbeh, Hamed, Monazzah, Amir Mahdi Hosseini, Miremadi, Seyed GhassemYear:
2014
Language:
english
DOI:
10.1109/dft.2014.6962091
File:
PDF, 181 KB
english, 2014