Contactless Photothermal Ionization Spectroscopy of Shallow Defects in Semiconductors
Andreev, Boris A., Ikonnikov, V.B., Koslov, E.B., Lifshits, T.M., Shmagin, V.B.Volume:
143-147
Year:
1994
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.143-147.1365
File:
PDF, 349 KB
1994