X-ray photoelectron spectroscopy and diffraction...

Journal of Crystal Growth 2015 / 04 Vol. 416

X-ray photoelectron spectroscopy and diffraction investigation of a metal–oxide-semiconductor heterostructure: Pt/Gd2O3/Si(111)

Ferrah, D., El Kazzi, M., Niu, G., Botella, C., Penuelas, J., Robach, Y., Louahadj, L., Bachelet, R., Largeau, L., Saint-Girons, G., Liu, Q., Vilquin, B., Grenet, G.
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Volume:
416
Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2015.02.001
Date:
April, 2015
File:
PDF, 4.46 MB
english, 2015
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