[IEEE 2015 XVIII AISEM Annual Conference - Trento, Italy...

  • Main
  • [IEEE 2015 XVIII AISEM Annual...

[IEEE 2015 XVIII AISEM Annual Conference - Trento, Italy (2015.2.3-2015.2.5)] 2015 XVIII AISEM Annual Conference - Fabrication of single-nanowire sensing devices by electron beam lithography

Donarelli, Maurizio, Milan, Riccardo, Ferroni, Matteo, Faglia, Guido, Comini, Elisabetta, Sberveglieri, Giorgio, Ponzoni, Andrea, Baratto, Camilla
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2015
Language:
english
DOI:
10.1109/AISEM.2015.7066814
File:
PDF, 572 KB
english, 2015
Conversion to is in progress
Conversion to is failed