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[IEEE 2015 XVIII AISEM Annual Conference - Trento, Italy (2015.2.3-2015.2.5)] 2015 XVIII AISEM Annual Conference - Fabrication of single-nanowire sensing devices by electron beam lithography
Donarelli, Maurizio, Milan, Riccardo, Ferroni, Matteo, Faglia, Guido, Comini, Elisabetta, Sberveglieri, Giorgio, Ponzoni, Andrea, Baratto, CamillaYear:
2015
Language:
english
DOI:
10.1109/AISEM.2015.7066814
File:
PDF, 572 KB
english, 2015