Study of Defects in p-type Layers in III-nitride Laser...

MRS Proceedings 2006 / 1 Vol. 955

Study of Defects in p-type Layers in III-nitride Laser Diode Structures Grown by Molecular Beam Epitaxy

Xiu, Huixin, Costa, Pedro MFJ, Kauer, Matthias, Smeeton, Tim M, Hooper, Stewart E, Heffernan, Jonathan, Humphreys, Colin J
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Volume:
955
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-0955-I04-07
Date:
January, 2006
File:
PDF, 2.71 MB
english, 2006
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