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Correlation between structural and electrical properties of InN thin films prepared by molecular beam epitaxy
V. Lebedev, F.M. Morales, V. Cimalla, J.G. Lozano, D. González, M. Himmerlich, S. Krischok, J.A. Schaefer, O. AmbacherVolume:
40
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.spmi.2006.07.006
File:
PDF, 542 KB
english, 2006