Scanning electron and laser beams induced current (SELBIC) method for observing failures in GaAs high electron mobility transistors
Haruki Sueyoshi, Shin-ichi Takasu, Woon Choi, Hajime TomokageVolume:
45
Year:
2009
Language:
english
Pages:
7
DOI:
10.1016/j.spmi.2008.11.017
File:
PDF, 1.16 MB
english, 2009