Scanning Conductance Microscopy and High Frequency Scanning...

MRS Proceedings 2004 / 1 Vol. 838

Scanning Conductance Microscopy and High Frequency Scanning Gate Microscopy of Carbon Nanotubes and Polyethylene based Nanofibers

Staii, Cristian, Shao, Rui, Pinto, Nicholas J., Bonnell, Dawn A., Johnson, Alan T.
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Volume:
838
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-838-O9.8
Date:
January, 2004
File:
PDF, 166 KB
english, 2004
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