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Determination of Stability Areas of Yb- and Nd-α-SiAlON Phases Using the Rietveld Method
Herrmann, Mathias, Holzer, Stefan, Hoffmann, Michael J.Volume:
264-268
Year:
2004
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.264-268.1075
File:
PDF, 198 KB
english, 2004