[ACM Press the 2005 ACM SIGPLAN conference - Chicago, IL, USA (2005.06.12-2005.06.15)] Proceedings of the 2005 ACM SIGPLAN conference on Programming language design and implementation - PLDI '05 - Scalable statistical bug isolation
Liblit, Ben, Naik, Mayur, Zheng, Alice X., Aiken, Alex, Jordan, Michael I.Year:
2005
Language:
english
DOI:
10.1145/1065010.1065014
File:
PDF, 176 KB
english, 2005