High-resolution electron microscopy of microstructure of...

Solid State Communications 2007 Vol. 143; Iss. 3

High-resolution electron microscopy of microstructure of MnF2 subjected to shock compression at 4.4 GPa

Kunio Yubuta, Teruhisa Hongo, Toshiyuki Atou, Kazutaka G. Nakamura, Ken-ichi Kondo, Masae Kikuchi
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Volume:
143
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.ssc.2007.05.008
File:
PDF, 1.01 MB
english, 2007
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