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ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - The Reliability Study and Device Modeling for p-HEMT Microwave Power Transistors
Liu, Szu-Ling, Chang, H.M., Chang, Tsu, Kao, Hsuan-Ling, Cheng, Chun-Hu, Chin, AlbertYear:
2011
Language:
english
DOI:
10.1149/1.3629965
File:
PDF, 880 KB
english, 2011