Experimental and Theoretical Investigation of Minimization of Forming-Induced Variability in Resistive Memory Devices
Geist, Brian L., Strukov, Dmitri, Kochergin, VladimirVolume:
1729
Year:
2015
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/opl.2015.83
File:
PDF, 9.75 MB
english, 2015