Cycle Testing of Supercapacitors for Long-Life Robust...

IEEE Transactions on Power Electronics 2015 / 5 Vol. 30; Iss. 5

Cycle Testing of Supercapacitors for Long-Life Robust Applications

Murray, Donal B., Hayes, John G.
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Volume:
30
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/tpel.2014.2373368
Date:
May, 2015
File:
PDF, 1.77 MB
english, 2015
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