EPR parameter factors and defect structures for ions in...

Solid State Communications 2010 Vol. 150; Iss. 43-44

EPR parameter factors and defect structures for ions in semiconductor

Shun-Ru Zhang, Shi-Fu Zhu, Bei-Jun Zhao
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
150
Year:
2010
Language:
english
Pages:
3
DOI:
10.1016/j.ssc.2010.08.027
File:
PDF, 202 KB
english, 2010
Conversion to is in progress
Conversion to is failed