Measurement of Residual Strains with High Depth Resolution...

MRS Proceedings 2004 / 1 Vol. 840

Measurement of Residual Strains with High Depth Resolution by Energy-Variable Diffraction on Synchrotron Beam Lines

Zolotoyabko, E., Pokroy, B., Quintana, J. P.
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Volume:
840
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-840-Q7.7
Date:
January, 2004
File:
PDF, 55 KB
english, 2004
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