The influence of interface states and bulk carrier lifetime on the minority carrier behavior in an illuminated metal/insulator/GaN structure
Marcin Miczek, Piotr Bidziński, Bogusława Adamowicz, Chihoko Mizue, Tamotsu HashizumeVolume:
151
Year:
2011
Language:
english
Pages:
4
DOI:
10.1016/j.ssc.2011.03.021
File:
PDF, 295 KB
english, 2011