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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - The improved method to determine the nucleation region of Si nanoparticles formed during pulsed laser ablation
Chu, Lizhi, Chen, Chao, Ding, Xuecheng, Deng, Zechao, Zhang, Hengsheng, Liang, Weihua, Chen, Jinzhong, Fu, Guangsheng, Wang, Yinglong, Yang, Li, Namba, Yoshiharu, Walker, David D., Li, ShengyiVolume:
7655
Year:
2010
Language:
english
DOI:
10.1117/12.867055
File:
PDF, 1.03 MB
english, 2010