Observation of fluctuation-induced tunneling conduction in micrometer-sized tunnel junctions
Lai, Yu-Ren, Yu, Kai-Fu, Lin, Yong-Han, Wu, Jong-Ching, Lin, Juhn-JongVolume:
2
Year:
2012
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4749251
File:
PDF, 1.30 MB
english, 2012